Silicon 1s near edge X-ray absorption fine structure spectroscopy of functionalized silicon nanocrystals

A. Ritchie, W. Cao, M. Dasog, T. K. Purkait, C. Senger, Y. F. Hu, Q. F. Xiao, J. G.C. Veinot, S. G. Urquhart

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

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Keyphrases

Engineering

Physics