Silicon 1s near edge X-ray absorption fine structure spectroscopy of functionalized silicon nanocrystals

A. Ritchie, W. Cao, M. Dasog, T. K. Purkait, C. Senger, Y. F. Hu, Q. F. Xiao, J. G.C. Veinot, S. G. Urquhart

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)
Original languageEnglish
Article number154703
JournalJournal of Chemical Physics
Volume145
Issue number15
DOIs
Publication statusPublished - Oct 21 2016
Externally publishedYes

ASJC Scopus Subject Areas

  • General Physics and Astronomy
  • Physical and Theoretical Chemistry

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Ritchie, A., Cao, W., Dasog, M., Purkait, T. K., Senger, C., Hu, Y. F., Xiao, Q. F., Veinot, J. G. C., & Urquhart, S. G. (2016). Silicon 1s near edge X-ray absorption fine structure spectroscopy of functionalized silicon nanocrystals. Journal of Chemical Physics, 145(15), Article 154703. https://doi.org/10.1063/1.4964371