Probing the origins of electroresistance switching behavior in ferroelectric thin films

Zhong Qi Ren; Yan Dong Liu; Si Yao Bao; Nan Yang; Ni Zhong; Xiao Dong Tang; Ping Hua Xiang; Chun Gang Duan

doi:10.1063/1.5119970

Probing the origins of electroresistance switching behavior in ferroelectric thin films

Zhong Qi Ren, Yan Dong Liu, Si Yao Bao, Nan Yang, Ni Zhong, Xiao Dong Tang, Ping Hua Xiang, Chun Gang Duan

科研成果: 期刊稿件 › 文章 › 同行评审

源语言	英语
文章编号	242901
期刊	Applied Physics Letters
卷	115
期	24
DOI	https://doi.org/10.1063/1.5119970
出版状态	已出版 - 12月 9 2019
已对外发布	是

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物理与天文学（杂项）

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AU - Xiang, Ping Hua

AU - Duan, Chun Gang

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Probing the origins of electroresistance switching behavior in ferroelectric thin films

!!!ASJC Scopus Subject Areas

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