Battery desing selection and evaluation for high criticality applications: Perspectives from the medical device industry

Gaurav Jain, Craig Schmidt, Hui Ye, Erik Scott, Jeff Dahn, Chao Hu

科研成果: 会议稿件的类型 › 论文 › 同行评审

源语言	英语
出版状态	已出版 - 2017
活动	34th Annual International Battery Seminar and Exhibit - Fort Lauderdale, 美国期限: 3月 20 2017 → 3月 23 2017

会议	34th Annual International Battery Seminar and Exhibit
国家/地区	美国
市	Fort Lauderdale
时期	3/20/17 → 3/23/17

!!!ASJC Scopus Subject Areas

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author = "Gaurav Jain and Craig Schmidt and Hui Ye and Erik Scott and Jeff Dahn and Chao Hu",

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T2 - 34th Annual International Battery Seminar and Exhibit

AU - Jain, Gaurav

AU - Schmidt, Craig

AU - Ye, Hui

AU - Scott, Erik

AU - Dahn, Jeff

AU - Hu, Chao

PY - 2017

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Y2 - 20 March 2017 through 23 March 2017

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