An under Sampling Scope for Characterization of 42-Gs/s DAC in 28-nm FD-SOI

Mahdi Parvizi; Sadok Aouini; Mohammad S. Mahani; Naim Ben-Hamida; Jean Francois Bousquet; Chris Kurowski

doi:10.1109/LMWC.2018.2837864

An under Sampling Scope for Characterization of 42-Gs/s DAC in 28-nm FD-SOI

Mahdi Parvizi, Sadok Aouini, Mohammad S. Mahani, Naim Ben-Hamida, Jean Francois Bousquet, Chris Kurowski

Chemical Engineering

科研成果: 期刊稿件 › 文章 › 同行评审

2 引用（Scopus）

源语言	英语
页（从-至）	621-623
页数	3
期刊	IEEE Microwave and Wireless Components Letters
卷	28
期	7
DOI	https://doi.org/10.1109/LMWC.2018.2837864
出版状态	已出版 - 7月 2018

!!!ASJC Scopus Subject Areas

凝聚态物理学
电气与电子工程

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10.1109/LMWC.2018.2837864

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An under Sampling Scope for Characterization of 42-Gs/s DAC in 28-nm FD-SOI

!!!ASJC Scopus Subject Areas

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