Keyphrases
B-site
33%
C-axis
33%
Close-packed
33%
Crystallographic Characterization
100%
Dielectric
33%
Dielectric Resonance
33%
Face-sharing
33%
Hexagonal Perovskite
100%
High-permittivity
100%
Impedance Spectroscopy
33%
Insulator
33%
K(I)
33%
Microwave Dielectrics
33%
Microwave Frequency
33%
Mixed Oxides
33%
Mn(IV)
66%
Neutron Diffraction Data
33%
Octahedral Sites
100%
Octahedron
66%
Packed Layer
33%
Partial Order
33%
Radio Frequency
33%
Resonance Measurement
33%
Rietveld Refinement
33%
Room Temperature
66%
Stacking Sequence
33%
Substructure
33%
Temperature Coefficient of Resonant Frequency
33%
Ti(IV)
66%
Trimer
100%
Unloaded Quality Factor
33%
X-ray Density
33%
X-ray Powder Diffraction Data
33%
Chemistry
Ambient Reaction Temperature
100%
Crystal Structure
100%
Dielectric Material
100%
Dielectric Spectroscopy
50%
Neutron Diffraction
50%
Octahedral Crystal
100%
Permittivity
100%
Powder X-Ray Diffraction
50%
Primary Structure
50%
R3-M
50%
Rietveld Refinement
50%
Space Group
50%
Engineering
Crystal Structure
100%
Dielectrics
100%
Joints (Structural Components)
50%
Microwave Frequency
50%
Quality Factor
50%
Radio Frequency
50%
Resonant Frequency
50%
Room Temperature
100%
Space Group
50%
Temperature Coefficient
50%
Material Science
Crystal Structure
100%
Density
50%
Dielectric Material
100%
Dielectric Spectroscopy
50%
Neutron Diffraction
50%
Oxide Compound
50%
Permittivity
100%
Powder X-Ray Diffraction
50%
Rietveld Refinement
50%