Dynamics of Negative Capacitance induced by Ferroelectric Switching in Ferroelectric-Resistor Circuit

Yulong Dong; Danyang Chen; Ni Zhong; Jingquan Liu; Chungang Duan; Xiuyan Li

doi:10.1109/EDTM50988.2021.9421055

Dynamics of Negative Capacitance induced by Ferroelectric Switching in Ferroelectric-Resistor Circuit

Yulong Dong, Danyang Chen, Ni Zhong, Jingquan Liu, Chungang Duan, Xiuyan Li

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	2021 5th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2021
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781728181769
DOIs	https://doi.org/10.1109/EDTM50988.2021.9421055
Publication status	Published - Apr 8 2021
Externally published	Yes
Event	5th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2021 - Chengdu, China Duration: Apr 8 2021 → Apr 11 2021

Publication series

Name	2021 5th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2021

Conference

Conference	5th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2021
Country/Territory	China
City	Chengdu
Period	4/8/21 → 4/11/21

ASJC Scopus Subject Areas

Electrical and Electronic Engineering
Industrial and Manufacturing Engineering
Electronic, Optical and Magnetic Materials

Keywords

Ferroelectric switching dynamics
Negative capacitance

Access to Document

10.1109/EDTM50988.2021.9421055

Cite this

Dong, Y., Chen, D., Zhong, N., Liu, J., Duan, C., & Li, X. (2021). Dynamics of Negative Capacitance induced by Ferroelectric Switching in Ferroelectric-Resistor Circuit. In 2021 5th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2021 Article 9421055 (2021 5th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2021). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EDTM50988.2021.9421055

Dynamics of Negative Capacitance induced by Ferroelectric Switching in Ferroelectric-Resistor Circuit. / Dong, Yulong; Chen, Danyang; Zhong, Ni et al.
2021 5th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2021. Institute of Electrical and Electronics Engineers Inc., 2021. 9421055 (2021 5th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2021).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Dong, Y, Chen, D, Zhong, N, Liu, J, Duan, C & Li, X 2021, Dynamics of Negative Capacitance induced by Ferroelectric Switching in Ferroelectric-Resistor Circuit. in 2021 5th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2021., 9421055, 2021 5th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2021, Institute of Electrical and Electronics Engineers Inc., 5th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2021, Chengdu, China, 4/8/21. https://doi.org/10.1109/EDTM50988.2021.9421055

Dong Y, Chen D, Zhong N, Liu J, Duan C, Li X. Dynamics of Negative Capacitance induced by Ferroelectric Switching in Ferroelectric-Resistor Circuit. In 2021 5th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2021. Institute of Electrical and Electronics Engineers Inc. 2021. 9421055. (2021 5th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2021). doi: 10.1109/EDTM50988.2021.9421055

Dong, Yulong ; Chen, Danyang ; Zhong, Ni et al. / Dynamics of Negative Capacitance induced by Ferroelectric Switching in Ferroelectric-Resistor Circuit. 2021 5th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2021. Institute of Electrical and Electronics Engineers Inc., 2021. (2021 5th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2021).

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title = "Dynamics of Negative Capacitance induced by Ferroelectric Switching in Ferroelectric-Resistor Circuit",

keywords = "Ferroelectric switching dynamics, Negative capacitance",

author = "Yulong Dong and Danyang Chen and Ni Zhong and Jingquan Liu and Chungang Duan and Xiuyan Li",

note = "Publisher Copyright: {\textcopyright} 2021 IEEE.; 5th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2021 ; Conference date: 08-04-2021 Through 11-04-2021",

year = "2021",

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day = "8",

doi = "10.1109/EDTM50988.2021.9421055",

language = "English",

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AU - Dong, Yulong

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AU - Zhong, Ni

AU - Liu, Jingquan

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AU - Li, Xiuyan

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M3 - Conference contribution

AN - SCOPUS:85106496568

T3 - 2021 5th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2021

BT - 2021 5th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2021

PB - Institute of Electrical and Electronics Engineers Inc.

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Y2 - 8 April 2021 through 11 April 2021

ER -

Dynamics of Negative Capacitance induced by Ferroelectric Switching in Ferroelectric-Resistor Circuit

Publication series

Conference

ASJC Scopus Subject Areas

Keywords

Access to Document

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