@article{694ddbc1831b45e0a4a0f0a7c1e8c2e9,
title = "Direct atomic-scale visualization of the 90° domain walls and their migrations in Hf0.5Zr0.5O2 ferroelectric thin films",
keywords = "90° domain wall, Ferroelectric, HZO, Scanning transmission electron microscope",
author = "Yunzhe Zheng and Yuke Zhang and Tianjiao Xin and Yilin Xu and Shuangquan Qu and Junding Zheng and Zhaomeng Gao and Qilan Zhong and Yiwei Wang and Xiaoyu Feng and Yonghui Zheng and Yan Cheng and Ruiwen Shao and Fang Lin and Xiaoling Lin and He Tian and Rong Huang and Chungang Duan and Hangbing Lyu",
note = "Publisher Copyright: {\textcopyright} 2023 Elsevier Ltd",
year = "2023",
month = dec,
doi = "10.1016/j.mtnano.2023.100406",
language = "English",
volume = "24",
journal = "Materials Today Nano",
issn = "2588-8420",
publisher = "Elsevier Ltd.",
}