Direct atomic-scale visualization of the 90° domain walls and their migrations in Hf0.5Zr0.5O2 ferroelectric thin films

Yunzhe Zheng, Yuke Zhang, Tianjiao Xin, Yilin Xu, Shuangquan Qu, Junding Zheng, Zhaomeng Gao, Qilan Zhong, Yiwei Wang, Xiaoyu Feng, Yonghui Zheng, Yan Cheng, Ruiwen Shao, Fang Lin, Xiaoling Lin, He Tian, Rong Huang, Chungang Duan, Hangbing Lyu

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)
Original languageEnglish
Article number100406
JournalMaterials Today Nano
Volume24
DOIs
Publication statusPublished - Dec 2023
Externally publishedYes

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Biomaterials
  • Condensed Matter Physics
  • Materials Chemistry

Keywords

  • 90° domain wall
  • Ferroelectric
  • HZO
  • Scanning transmission electron microscope

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