Digital built-in self-test of CMOS analog iterative decoders

Mimi Yiu; Vincent C. Gaudet; Christian Schlegel; Chris Winstead

doi:10.1109/ISCAS.2005.1465059

Digital built-in self-test of CMOS analog iterative decoders

Mimi Yiu, Vincent C. Gaudet, Christian Schlegel, Chris Winstead

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Article number	1465059
Pages (from-to)	2204-2207
Number of pages	4
Journal	Proceedings - IEEE International Symposium on Circuits and Systems
DOIs	https://doi.org/10.1109/ISCAS.2005.1465059
Publication status	Published - 2005
Externally published	Yes
Event	IEEE International Symposium on Circuits and Systems 2005, ISCAS 2005 - Kobe, Japan Duration: May 23 2005 → May 26 2005

ASJC Scopus Subject Areas

Electrical and Electronic Engineering

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10.1109/ISCAS.2005.1465059

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@article{a322b41b86e743308c8f3b2fe7d5d13f,

title = "Digital built-in self-test of CMOS analog iterative decoders",

author = "Mimi Yiu and Gaudet, {Vincent C.} and Christian Schlegel and Chris Winstead",

year = "2005",

doi = "10.1109/ISCAS.2005.1465059",

language = "English",

pages = "2204--2207",

journal = "Proceedings - IEEE International Symposium on Circuits and Systems",

issn = "0271-4310",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "IEEE International Symposium on Circuits and Systems 2005, ISCAS 2005 ; Conference date: 23-05-2005 Through 26-05-2005",

}

TY - JOUR

T1 - Digital built-in self-test of CMOS analog iterative decoders

AU - Yiu, Mimi

AU - Gaudet, Vincent C.

AU - Schlegel, Christian

AU - Winstead, Chris

PY - 2005

Y1 - 2005

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U2 - 10.1109/ISCAS.2005.1465059

DO - 10.1109/ISCAS.2005.1465059

M3 - Conference article

AN - SCOPUS:34547867479

SN - 0271-4310

SP - 2204

EP - 2207

JO - Proceedings - IEEE International Symposium on Circuits and Systems

JF - Proceedings - IEEE International Symposium on Circuits and Systems

M1 - 1465059

T2 - IEEE International Symposium on Circuits and Systems 2005, ISCAS 2005

Y2 - 23 May 2005 through 26 May 2005

ER -

Digital built-in self-test of CMOS analog iterative decoders

ASJC Scopus Subject Areas

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