@inproceedings{4e0211ab496d4e0db105988e2db62766,
title = "A self-healing technique using ZTC biasing for PVT variations compensation in 65nm CMOS technology",
author = "Hamidreza Nateghi and Kamal El-Sankary",
note = "Publisher Copyright: {\textcopyright} 2015 IEEE.; 2015 28th IEEE Canadian Conference on Electrical and Computer Engineering, CCECE 2015 ; Conference date: 03-05-2015 Through 06-05-2015",
year = "2015",
month = jun,
day = "19",
doi = "10.1109/CCECE.2015.7129173",
language = "English",
series = "Canadian Conference on Electrical and Computer Engineering",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "June",
pages = "128--131",
booktitle = "2015 IEEE 28th Canadian Conference on Electrical and Computer Engineering, CCECE 2015",
address = "United States",
edition = "June",
}